DESIGN AND IMPLEMENTATION OF MODIFIED CLOCK GENERATION

Bibi Hajira, Nayana M, Siva Yellampalli, Mujthaba

Abstract: Performing delay test needs the automatic test equipment (ATE) which is used to provide the high-speed clocks, which is then used to generate at-speed test. ATE has some limitations such as it has limited number of clock pins, and is limited in supplying maximum clock frequencies. Expensive ATE has number of pins that works in high frequencies but that will be very expensive to go with to avoid that in this project at speed pulses is generated by a logic that is given to STUMP based LBIST

Keywords: ATE, LBIST

DOI: https://doi.org/10.15623/ijret.2016.0508010