IJRET
  • CrossRef
  • Google Scholar
  • ischolar
  • Index Copernicus
  • IJRET
  • Alternate Text
  • IJRET
  • IJRET
  • IJRET
  • Alternate Text
  • IJRET
  • IJRET
  • IJRET
  • IJRET
  • IJRET
  • IJRET
  • IJRET
Authors will receive one hard copy of full paper, individual print certificates and digital certificates, Submit Manuscript

CALL FOR PAPERS : DEC-2018

Submission Last Date :  30-Dec-2018
Acceptance Notification :  in 15 days
Publication Date :  in 5 days
Submit Manuscript Online

FOR AUTHORS

FOR REVIEWERS

IJRET® PUBLICATIONS

DOWNLOADS

CONTACT US

NEWS & UPDATES

Call for Paper Vol-7 Iss-02 Feb-2018

IJRET invites papers from various engineering disciplines for Volume-07 Issue-02, Feb-2018.

Submit Manuscript

Published Vol-07 Iss-01 Jan-18

IJRET Volume-07 Issue-01, Jan-2018 is published now.

Browse Papers

A LOW COST NIR BASED EMBEDDED SYSTEM FOR FRUIT QUALITY ASSESSMENT

Arathy Shaji, Liju Philip

Abstract: India is one of the largest producers of fruits in the world.Banana, pineapple and mango are the major fruits produced in our country. In fruits, internal defects, presence of worms, etc. needs to be detected. Recently Computer Vision System (CVS) and image processing are used for evaluating external visual quality factors such as colour, shape, etc. Various non-destructive technologies such as VIS/NIR spectroscopy, ultrasonic, X-ray and MRI are used for evaluating internal quality factors such as sugar content, acid content, etc. But in India, there is lack of such improved technologies and instrumentation for getting right information about quality since these techniques are highly expensive. Thus sorting of fruits is done manually. In manual sorting, it is hardly possible to detect the internal defects.This has resulted in rejection of fruits for export from India. Thus there is a need to develop an embedded system to detect the internal defects including the presence of worms in fruits. In this work NIR based imaging is used for low cost detection of presence of worms in fruits.

Keywords: fruits,CVS,NIR,low cost, non-destructive, internal defects,quality

DOI: https://doi.org/10.15623/ijret.2015.0409023

Home | Publication Ethics | Privacy Policy | Terms & Conditions | Refund Policy | Feedback | Contact Us
Copyright © 2012-2018 IJRET Journal All rights reserved