STUDY OF BAD BLOCK MANAGEMENT AND WEAR LEVELING IN NAND FLASH MEMORIES

Supriya Kulkarni P, Jisha P

Abstract: NAND Flash devices have become preferred choice in high density, low cost and high read and write operations where in very large sequential data has to repeatedly written and read at higher rate. However it is hindered by a character called “Lifetime”. Typically NAND Flash devices wear out providing around 10,000 to 100,000 life cycles. In this paper we are concerned to discuss about the techniques called Bad-Block Management (BBM) and Wear-leveling to increase the Lifetime of the NAND Flash memories.

Keywords: NAND Flash memory, BBM, Wear-leveling, Lifetime.

DOI: https://doi.org/10.15623/ijret.2013.0210042