HIGH PERFORMANCE NOVEL DUAL STACK GATING TECHNIQUE FOR REDUCTION OF GROUND BOUNCE

K. Srinivasa Rao, Ravinder Kaur, Palwinder Kaur

Abstract: The development of digital integrated circuits is challenged by higher power consumption. The combination of higher clock speeds, greater functional integration, and smaller process geometries has contributed to significant growth in power density. Today leakage power has become an increasingly important issue in processor hardware and software design. So to reduce the leakages in the circuit many low power strategies are identified and experiments are carried out. But the leakage due to ground connection to the active part of the circuit is very higher than all other leakages. As it is mainly due to the back EMF of the ground connection we are calling it as ground bounce noise. To reduce this noise, different methodologies are designed. In this paper, a number of critical considerations in the sleep transistor design and implementation includes header or footer switch selection, sleep transistor distribution choices and sleep transistor gate length, width and body bias optimization for area, leakage and efficiency. Novel dual stack technique is proposed that reduces not only the leakage power but also dynamic power. The previous techniques are summarized and compared with this new approach and comparison of both the techniques is done with the help of Digital Schematic( DSCH ) and Microwind low power tools. Stacking power gating technique has been analyzed and the conditions for the important design parameters (Minimum ground bounce noise) have been derived. The Monte-Carlo simulation is performed in Microwind to calculate the values of all the needed parameters for comparison.

Keywords: Ground Bounce Noise ,Power gating schemes ,Static power dissipation, Dynamic power dissipation, Power gating parameters, Sleep transistors, Novel dual stack approach, Transistor leakage power

DOI: https://doi.org/10.15623/ijret.2013.0208043