TESTING OF MEMORY USING FRANKLIN METHOD

Mythri Myneni, Madhavi Mallam

Abstract: It is natural to be skeptical when someone says it is possible to determine the state-of-health of a complex integrated circuit with a few simple tests. Justifiable doubt in the unfamiliar can be aided by experience and investment in a traditional approach [5]. So only the process known as testing is involved after each and every design. Fault may occur even in the memory .So we are going to test the memory in this paper by the most suitable method [4]. Therefore we are going to test the memory using one of the pattern sensitivity test method i.e., Franklin method by Verilog approach [6]. The results obtained are in excellent agreement with theoretical results.

Keywords: Memory, RAM, Pattern sensitivity test, Franklin Method, Verilog approach

DOI: https://doi.org/10.15623/ijret.2012.0104010